Compliance with the control efficiency requirements for an add-on control device used to reduce VOC emissions from the dryer exhaust of heatset inks used in offset lithography, pursuant to Env-A 1216.03(a), shall be demonstrated using the test methods and procedures described in the following rules, as applicable:

1. (a) Env-A 802, Compliance Stack Testing for Stationary Sources;
2. (b) Env-A 804.12 through Env-A 804.14, Compliance Stack Testing for VOCs;
3. (c) Env-A 804.15 Mass Balance Alternative to Compliance Stack Testing for VOC; and
4. (d) Env-A 805, Capture Efficiency.

Source. #7788, eff 10-31-02; ss by #9802, eff 10-31-10 (from Env-A 804.17); ss by #12762, eff 5-1-19